BRAND / VENDOR: Agilent

Agilent, G8010-68018, Replacement O-ring, 0.799 inch id, 0.103 cross section, for axial view pre-optics window assembly, Agilent 5000 series ICP-OES

CATALOG NUMBER: G8010-68018

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Product Description

Replacement O-ring, 0.799 inch id, 0.103 cross section, for axial view pre-optics window assembly, Agilent 5000 series ICP-OES. Compatible with 5100 / 5110 / 5800 and 5900 ICP-OES. Not required for instruments with dedicated Radial view only

Specifications:
Instrument Compatibility: 5100511058005900
UNSPSC Code: 41113000
Viewing Angle: Axial

**********The following product description is generated by AI and is for reference only. If you have any questions, please contact customer service.**********
This replacement O-ring is specifically designed for the axial view pre-optics window assembly in Agilent 5000 series ICP-OES instruments. With an inner diameter of 0.799 inches and a cross section of 0.103 inches, it ensures a precise, reliable seal, preventing sample contamination and maintaining consistent optical performance during inductively coupled plasma optical emission spectrometry workflows. This component is essential for laboratories performing elemental analysis in fields such as environmental monitoring, food safety, pharmaceuticals, and materials science. Its high-quality construction supports long-term resistance to laboratory solvents, acids, and elevated temperatures commonly encountered during plasma operation. Using a genuine replacement O-ring extends instrument uptime, reduces maintenance frequency, and safeguards the sensitive alignment and clarity of the pre-optics window, directly contributing to accurate signal transmission and reproducible analytical results. The O-ring can be easily installed during routine instrument service or as part of preventative maintenance to minimize downtime. This component is fully compatible with related pre-optics window assemblies within the designated instrument series and is recommended for laboratories committed to ensuring instrument reliability and data integrity in demanding trace element analysis workflows.

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